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Atomic Force Microscopy One Day Short Course: Beginners

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Atomic Force Microscopy One Day Short Course: Beginners

January 2018 Session

This unique short course combines an introduction to AFM with hands-on training in a one-day session. It is ideal for students, academics and industrialists or anyone requiring initial training in this valuable technique.

Course Code

SCI-PBS-ATOM-MIC

Course Date

24th January 2018

Places Available

5

Course Leader

Dr James Smith

Course Fee

£350.00
Course Description

AFM is a Nobel Prize-winning microscopy technique that provides high-resolution imaging of and physical properties data acquisition from biological or materials surfaces. The technique has many advantages over scanning electron microscopy: little or no sample preparation, metal coatings not being required and imaging in air or in liquid.

This one-day short course provides an introduction to the technique, maximising your hands-on use of the AFM with supporting theory being explained as we proceed through the day.

Content will include: Technique overview, sample preparation, imaging modes, imaging in liquids, and image analysis. A number of samples will be investigated and there will be plenty of time for questions. A take-away manual, which you can annotate throughout the day, will be provided, as will an attendance certificate.

The course will be taught by Dr James R Smith whom has over 20 years of AFM experience. The course will be invaluable for those venturing out with this exciting technique or those requiring initial or catch-up training.

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